Quantum-mechanical analysis of the elastic propagation of electrons in the Au/Si system: Application to ballistic-electron-emission microscopy
Quantum-mechanical analysis of the elastic propagation of electrons in the Au/Si system: Application to ballistic-electron-emission microscopy
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Au/Si 系统中电子弹性传播的量子力学分析：在弹道电子发射显微镜中的应用
DOI：
10.1103/physrevb.58.14036
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发表时间：
1998
影响因子：
3.7
通讯作者：
K. Heinz
中科院分区：
文献类型：
--
作者：
K. Reuter;P. D. Andres;F. García;D. Šestović;F. Flores;K. Heinz
我们提出了一种基于原子轨道线性组合的格林函数方法来计算从扫描隧道显微镜尖端注入金属薄膜的电子的弹性传播。得到的二维电流分布在实空间和倒易空间中，很好地表示了弹道电子发射显微镜的弹性分量。电流。由于该组件精确地近似于近阈值区域的总电流，因此与先前的分析相比，该程序允许在这些实验的建模中考虑金属带结构的影响。Au带结构，特别是在@111#和@100#方向上出现的间隙，很好地解释了Au/Si~111！和非盟/ Si ~ 100 !@s0163——1829 ~ 98 !01243 - 0 #
We present a Green’s-function approach based on a linear combination of atomic orbitals scheme to compute the elastic propagation of electrons injected from a scanning tunneling microscope tip into a metallic film. The obtained two-dimensional current distributions in real and reciprocal space furnish a good representation of the elastic component of ballistic electron emission microscopy ~BEEM! currents. Since this component accurately approximates the total current in the near-threshold region, this procedure allows—in contrast to prior analyses—to take into account effects of the metal band structure in the modeling of these experiments. The Au band structure, and in particular its gaps appearing in the @111# and @100# directions, provides a good explanation for the previously irreconcilable results of nanometric resolution and similarity of BEEM spectra on both Au/Si~111! and Au/Si~100!. @S0163-1829~98!01243-0#