High-Resolution Frequency-Modulation Atomic Force Microscopy in Liquids Using Electrostatic Excitation Method
High-Resolution Frequency-Modulation Atomic Force Microscopy in Liquids Using Electrostatic Excitation Method
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DOI:
10.1143/apex.3.065205
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发表时间:
2010-01-01
影响因子:
2.3
通讯作者:
Yamada, Hirofumi
中科院分区:
文献类型:
--
作者:
Umeda, Ken-ichi;Oyabu, Noriaki;Yamada, Hirofumi
We developed a novel method to drive the cantilever oscillation for frequency modulation atomic force microscopy (FM-AFM) in liquid environments using electrostatic excitation. The cantilever with a gold backside coating was vibrated by applying an oscillating bias voltage between the cantilever backside and an optically transparent electrode used as a liquid cell window. The frequency spectrum of the oscillation shows a simple resonance curve without spurious peaks. The method does not require electrical conductivity of samples at all. In fact, both muscovite mica and potassium chloride surfaces in aqueous solutions were successfully imaged on an atomic scale. (C) 2010 The Japan Society of Applied Physics