Microstructural defects associated with enhanced magnetic flux pinning in YBCO/DyBCO/YBCO multilayered thin films
Microstructural defects associated with enhanced magnetic flux pinning in YBCO/DyBCO/YBCO multilayered thin films
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DOI：
10.1088/0953-2048/24/6/065017
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发表时间：
2011-06
影响因子：
3.6
通讯作者：
K. Develos-Bagarinao;H. Yamasaki
中科院分区：
文献类型：
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作者：
K. Develos-Bagarinao;H. Yamasaki
我们研究了脉冲激光沉积在ceo2缓冲蓝宝石衬底上的YBCO/DyBCO/YBCO多层膜中存在的微结构缺陷的性质，以阐明这些薄膜中磁钉钉增强的来源。相对较薄的YBCO薄膜含有高浓度的反相边界（APBs）和沿ab面取向的短程层错（SFs）。YBCO和DyBCO的多层薄层导致了相似的高度断裂的微观结构，apb和SFs均匀分布在整个厚度上。此外，多层还包含平行于c轴方向的细长缺陷，从DyBCO中间层发出并向顶层YBCO延伸。多层材料还发育了与c轴取向的细长缺陷相交的长程SFs，主要集中在DyBCO层和YBCO层上部区域，表明两类缺陷的形成具有相关性。YBCO/DyBCO/YBCO多层膜的微观结构特征与Jc对磁场角依赖性的评价具有良好的相关性，当磁场沿ab面排列时，Jc对YBCO/DyBCO多层膜的磁场角依赖性显著增强。
We investigated the nature of microstructural defects existing in YBCO/DyBCO/YBCO multilayers deposited by pulsed laser deposition on CeO2-buffered sapphire substrates to clarify the origin of magnetic flux pinning enhancement observed in these films. A relatively thin YBCO film contains high concentrations of antiphase boundaries (APBs) and short-range stacking faults (SFs) oriented along the ab plane. Multilayering thin layers of YBCO with DyBCO results in a similar highly faulted microstructure, with APBs and SFs homogeneously distributed throughout the thickness. In addition, multilayers have incorporated elongated defects, parallel to the c-axis direction, emanating from the DyBCO intermediate layer and extending towards the top YBCO layer. Multilayers have also developed long-range SFs which intersect the c-axis-oriented elongated defects and are mostly concentrated in the region of the DyBCO and the upper YBCO layer, indicating a correlation between the formation of the two types of defects. The microstructural features of the YBCO/DyBCO/YBCO multilayers correlate well with the evaluation of the magnetic field angular dependence of Jc, which revealed a significant enhancement when the field is aligned along the ab plane .