Dynamic test emulation for EDA-based mixed-signal test development automation
Dynamic test emulation for EDA-based mixed-signal test development automation
复制标题
基于 EDA 的混合信号测试开发自动化的动态测试仿真
DOI：
10.1109/test.1995.529907
复制
发表时间：
1995
期刊：
影响因子：
--
通讯作者：
N. Khouzam
中科院分区：
文献类型：
--
作者：
J. Xia;T. Austin;N. Khouzam
本文介绍了一个基于电子设计自动化（EDA）的测试开发自动化（TDA）系统的分析和开发。我们探讨了这样一个系统的必要性，并提供了一个真实的系统在工作中的例子。本文的重点是动态测试仿真的概念，它理解的混合信号测试往往包括通过使用复杂的数字和模拟测试模式，在不同的时间从大量的测量获得信息。我们的工作集中在将两个现有的社区，EDA和测试开发，通过连接它们各自独立的环境，并提供一个测试和设备开发平台，不需要物理集成电路和物理自动测试设备（ATE）系统的存在。
This paper presents the analysis and development of an Electronic Design Automation (EDA)-based Test Development Automation (TDA) system. We explore the need for such a system and provide a real example of the system at work. The focus of the paper is the concept of dynamic test emulation which understands that a mixed-signal test often consists of obtaining information from a large number of measurements taken at different times through the use of complex digital and analog test patterns. Our work concentrates on bringing together two existing communities, EDA and test development, by linking their separate environments and providing a platform for test and device development that does not require the existence of a physical integrated circuit and a physical Automatic Test Equipment (ATE) system.