Plasmid DNA damage induced by helium atmospheric pressure plasma jet
Plasmid DNA damage induced by helium atmospheric pressure plasma jet
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DOI：
10.1140/epjd/e2014-40753-y
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发表时间：
2014-03-11
影响因子：
1.8
通讯作者：
Ptasinska, Sylwia
中科院分区：
文献类型：
--
作者：
Han, Xu;Cantrell, William A.;Ptasinska, Sylwia
采用氦气大气压等离子体射流(APPJ)对含水的质粒DNA进行损伤。用琼脂糖凝胶电泳法测定DNA构象的结果部分，它表明完整的分子或带有单链或双链断裂的DNA。在不同电脉冲参数的两种等离子体源工作条件下，随着APPJ与DNA样品之间距离的减小，DNA链断裂增加。随着等离子体辐照时间的延长，对质粒DNA的损伤程度也随之增加。用光学发射光谱表征了APPJ中产生的反应物种，并讨论了它们在水环境中可能发生的DNA损伤过程中的作用。
A helium atmospheric pressure plasma jet (APPJ) is applied to induce damage to aqueous plasmid DNA. The resulting fractions of the DNA conformers, which indicate intact molecules or DNA with single- or double-strand breaks, are determined using agarose gel electrophoresis. The DNA strand breaks increase with a decrease in the distance between the APPJ and DNA samples under two working conditions of the plasma source with different parameters of applied electric pulses. The damage level induced in the plasmid DNA is also enhanced with increased plasma irradiation time. The reactive species generated in the APPJ are characterized by optical emission spectra, and their roles in possible DNA damage processes occurring in an aqueous environment are also discussed.