A Non-raster Scanning Approach in Atomic Force Microscopy Using a Combined Contour Prediction Algorithm

A Non-raster Scanning Approach in Atomic Force Microscopy Using a Combined Contour Prediction Algorithm
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DOI:
10.3182/20140824-6-za-1003.01683
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发表时间:
2014-09
期刊:
IFAC Proceedings Volumes
影响因子:
--
通讯作者:
Kaiqiang Zhang;G. Herrmann;C. Edwards;S. Burgess;M. Miles
Kaiqiang Zhang;G. Herrmann;C. Edwards;S. Burgess;M. Miles
中科院分区:
其他
文献类型:
--
作者:
Kaiqiang Zhang;G. Herrmann;C. Edwards;S. Burgess;M. Miles

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摘要:在本文中,我们提出了一种用于原子力显微镜高速成像的新型非光栅扫描算法。与最近针对串状样本的非光栅扫描算法相比,所提出的算法是针对细胞和其他简单样本样本开发的。该算法收集样本附近的数据,以创建不同高度的样本轮廓,从而构建目标样本的 3D 形貌。在扫描过程中,尖端根据轮廓曲率和轮廓切线的预测进行转向。所提出的扫描轨迹遵循样品的轮廓并避免穿过样品,同时最大限度地减少悬臂共振的可能激发。为了预测轮廓的曲率和切线,使用当前部分获得的轮廓和先前的轮廓扫描:通过从两个预测的可靠性评估导出的加权算法适当地组合来自两个轮廓的预测。与一些流行的非光栅扫描算法和光栅扫描相比,这允许以减少的扫描时间创建特定感兴趣的地形图像。提供了模拟结果。
Abstract In this paper, we present a novel non-raster scanning algorithm for high-speed imaging in Atomic Force Microscopy. In contrast to recent non-raster scanning algorithms for string-like samples, the proposed algorithm is developed for cells and other simple specimen samples. This algorithm collects data in the vicinity of the specimen to create sample contours at different heights to build the 3D topography of the target sample. During the scan process, the tip is steered based on a prediction of the contour curvature and contour tangent. The proposed scanning trajectory follows the contour of the sample and avoids crossing the specimen, while minimizing the possible excitation of resonances of the cantilever. For the prediction of the curvature and tangent of the contour, the current partially obtained contour and a previous contour scan are used: a prediction from both contours is suitably combined by a weighting algorithm derived from a reliability evaluation of both predictions. This permits the creation of topographical images of specific interest at a reduced scanning time in comparison to some prevalent non-raster scan algorithms and raster scans. Simulation results are provided.