Microscopic lamellar organization in high-density polyethylene banded spherulites studied by scanning probe microscopy

Microscopic lamellar organization in high-density polyethylene banded spherulites studied by scanning probe microscopy
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DOI:
10.1016/s0032-3861(02)00158-1
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发表时间:
2002-06-01
期刊:
影响因子:
4.6
通讯作者:
Kajiyama, T
Kajiyama, T
中科院分区:
化学2区
文献类型:
--
作者:
Sasaki, S;Sakaki, Y;Kajiyama, T

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用扫描探针显微镜研究了高密度聚乙烯(HDPE)带状球晶的表面形貌和片层聚集结构。采用等温结晶法制备了不同结晶温度下的HDPE薄膜。偏振近场扫描光学显微镜(NSOM)观察的HDPE薄膜显示亚微米尺度的表面形貌和带状球晶的双折射之间的相关性。薄膜表面沿着球晶半径的高度分布与透射光沿着消光环半径的强度分布相对应地周期性变化。这种相关性更清楚地观察到高锰蚀刻PE膜的地形和NSOM图像。因此,这显然表明,正交晶胞的晶体学c轴平行和垂直于膜表面的峰和谷的带状球晶,分别。通过偏振NSOM和原子力显微镜(AFM)得到的带间距是可比的偏振远场光学显微镜下观察交叉尼科尔。随着等温结晶温度的升高,谱带间距和峰谷高度差增大。原子力显微镜观察直接指示局部片层取向和堆叠方式。(C)2002爱思唯尔科技有限公司版权所有。
Surface topography and lamellar aggregation structure of high-density polyethylene (HDPE) banded spherulites were investigated by scanning probe microscopy. HDPE films were prepared by isothermal crystallization at various crystallization temperatures from the melt. Polarizing near-field scanning optical microscopic (NSOM) observations for the HDPE films revealed submicron-scale correlation between surface topography and birefringence of banded spherulites. The height profile of the film surface along the spherulitic radius periodically changed corresponding to the intensity profile of transmitted light along the radius of the extinction ring. This correlation was more clearly observed in the topographic and NSOM images of permanganic etched PE films. Therefore, it was apparently suggested that the crystallographic c-axis of the orthorhombic unit cell was parallel and perpendicular to the film surface at the peak and the valley in the surface corrugation of the banded spherulite, respectively. The band spacing obtained by polarizing NSOM and atomic force microscopy (AFM) was comparable to that determined by polarizing far-field optical microscopic observation under crossed nicols. The band spacing and the peak-to-valley height difference in the corrugation increased with an increase in isothermal crystallization temperature. AFM observations directly indicated local lamellar orientation and stacking manner. (C) 2002 Elsevier Science Ltd. All rights reserved.