植杉克弘: "STM observation of Ar ion bombarded Si(001) surfaces and regrowth processes by thermal annealing" Japanese Journal of Applied Physics. 32. 6203-6205 (1993)
植杉克弘: "STM observation of Ar ion bombarded Si(001) surfaces and regrowth processes by thermal annealing" Japanese Journal of Applied Physics. 32. 6203-6205 (1993)
复制标题
Katsuhiro Uesugi:“STM 观察 Ar 离子轰击 Si(001) 表面和通过热退火进行的再生长过程”《日本应用物理学杂志》32. 6203-6205 (1993)。
DOI:
--
复制
发表时间:
--
期刊:
影响因子:
--
通讯作者:
中科院分区:
文献类型:
--
作者: