High-precision SIMS oxygen, sulfur and iron stable isotope analyses of geological materials: accuracy, surface topography and crystal orientation

High-precision SIMS oxygen, sulfur and iron stable isotope analyses of geological materials: accuracy, surface topography and crystal orientation
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DOI:
10.1002/sia.3424
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发表时间:
2011-01-01
影响因子:
1.7
通讯作者:
Valley, J. W.
Valley, J. W.
中科院分区:
化学4区
文献类型:
--
作者:
Kita, N. T.;Huberty, J. M.;Valley, J. W.

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威斯康星州二次离子质谱实验室(WiscSIMS)使用Cameca IMS-1280建立了一种用于氧、硫和铁同位素比值的高精度西姆斯分析技术,并将其应用于广泛的地球科学研究领域。使用多收集法拉第杯(FC)探测器和10 μ m的初级Cs+束尺寸测量O-18/O-16比,常规达到0.3份/千份的精度和准确度。3 μ m至100 μ m的较小光束尺寸
A high-precision SIMS analysis technique has been established for oxygen, sulfur, and iron isotope ratios and applied to a wide range of geoscience research areas using a Cameca IMS-1280 at the Wisconsin Secondary Ion Mass Spectrometer Laboratory (WiscSIMS). Precision and accuracy of 0.3 parts per thousand is achieved routinely for the measurement of O-18/O-16 ratio using multicollection Faraday Cup (FC) detectors and primary Cs+ beam size of 10 mu m. Smaller beam sizes of 3 mu m to