On hazard-free patterns for fine-delay fault testing
On hazard-free patterns for fine-delay fault testing
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DOI：
10.1109/itc.2004.128
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发表时间：
2004-10
期刊：
影响因子：
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通讯作者：
B. Kruseman;A. Majhi;G. Gronthoud;S. Eichenberger
中科院分区：
文献类型：
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作者：
B. Kruseman;A. Majhi;G. Gronthoud;S. Eichenberger
这项工作提出了一种应用精细延迟故障测试的有效方法，以提高尤其是阻性开路的缺陷复盖率。该方法基于将传统的延迟-故障模式分组为几组几乎等长的路径。这缩小了总路径长度分布，并允许以更高的速度运行模式集，从而能够检测到小的延迟故障。这些小延迟故障在其他情况下是不可检测的，因为它们被较长的路径屏蔽。此方法的一个要求是具有无风险路径。为了获得这些(几乎)无风险的路径，我们使用快速而简单的后处理步骤来过滤出有风险的路径。实验数据表明了该过滤过程的有效性和必要性。
This work proposes an effective method for applying fine-delay fault testing in order to improve defect coverage of especially resistive opens. The method is based on grouping conventional delay-fault patterns into sets of almost equal-length paths. This narrows the overall path length distribution and allows running the pattern sets at a higher speed, thus enabling the detection of small delay faults. These small delay faults are otherwise undetectable because they are masked by longer paths. A requirement for this method is to have hazard-free paths. To obtain these (almost) hazard-free paths we use a fast and simple postprocessing step that filters out paths with hazards. The experimental data shows the effectiveness and the necessity of this filtering process.