Capturing transiently charged states at the C60/TiO2(110) interface by time-resolved soft X-ray photoelectron spectroscopy
Capturing transiently charged states at the C60/TiO2(110) interface by time-resolved soft X-ray photoelectron spectroscopy
复制标题
通过时间分辨软 X 射线光电子能谱捕获 C60/TiO2(110) 界面的瞬态带电状态
DOI:
10.1016/j.orgel.2016.01.020
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发表时间:
2016
影响因子:
3.2
通讯作者:
Iwao Matsuda
中科院分区:
文献类型:
--
作者:
Kenichi Ozawa;Susumu Yamamoto;Ryu Yukawa;Kazuma Akikubo;Masato Emori;Hiroshi Sakama;Iwao Matsuda
Time-resolved soft X-ray photoelectron spectroscopy is utilized to determine an energy level alignment and the photoexcited carrier dynamics at a C60/TiO2(110) interface. The interface electronic structure is characterized by a type II junction, which favors an injection of photoexcited electrons from C60to TiO2. Ultraviolet (UV) laser pulse irradiation induces transient shifts of both C 1s and Ti 2p core levels towards the higher binding energies. These energy shifts are caused by a laser-induced charge transfer between the C60layer and the TiO2(110) surface. Upon UV absorption, valence electrons of C60are promoted to unoccupied levels, followed by a resonant transfer to TiO2, leaving C60in a cationized state. On the TiO2(110) side, the electrons are injected into the conduction band to raise the carrier density so that downward bending of the TiO2band is induced. The UV-excited states of C60and TiO2have sufficiently longer lifetime than the lifetime of the electron–hole pairs in solid C60. The C60/TiO2(110) interface is, thus, proved to be efficient for separating the electron–hole pairs generated within the C60layer.