Thermal probing of energy dissipation in current-carrying carbon nanotubes
Thermal probing of energy dissipation in current-carrying carbon nanotubes
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DOI：
10.1063/1.3126708
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发表时间：
2009-05-15
影响因子：
3.2
通讯作者：
McEuen, Paul L.
中科院分区：
文献类型：
--
作者：
Shi, Li;Zhou, Jianhua;McEuen, Paul L.
用扫描热显微镜测量了载流碳纳米管的温度分布。得到的温度分布揭示了扩散和耗散电子输运在多壁纳米管和单壁纳米管的电压偏置时，高于0.1-0.2 eV的光学声子能量。多壁纳米管中超过90%的焦耳热被发现是沿着纳米管传导到两个金属接触。相比之下，对于单壁纳米管，约80%的焦耳热直接通过纳米管-基底界面传递。在纳米管中的平均温度上升被确定为在5-42 K每微瓦焦耳在纳米管中的热耗散的范围内。
The temperature distributions in current-carrying carbon nanotubes have been measured with a scanning thermal microscope. The obtained temperature profiles reveal diffusive and dissipative electron transport in multiwalled nanotubes and in single-walled nanotubes when the voltage bias was higher than the 0.1-0.2 eV optical phonon energy. Over 90% of the Joule heat in a multiwalled nanotube was found to be conducted along the nanotube to the two metal contacts. In comparison, about 80% of the Joule heat was transferred directly across the nanotube-substrate interface for single-walled nanotubes. The average temperature rise in the nanotubes is determined to be in the range of 5-42 K per microwatt Joule heat dissipation in the nanotubes.