Secondary ion mass spectrometry time of flight and in situ x‐ray photoelectron spectroscopy studies of polymer surface modifications by a remote oxygen plasma treatment
Secondary ion mass spectrometry time of flight and in situ x‐ray photoelectron spectroscopy studies of polymer surface modifications by a remote oxygen plasma treatment
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远程氧等离子体处理聚合物表面改性的二次离子质谱飞行时间和原位 X 射线光电子能谱研究
DOI：
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发表时间：
1994
期刊：
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通讯作者：
T. Duc
中科院分区：
文献类型：
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作者：
L. Lianos;D. Parrat;Tran Quoc Hoc;T. Duc
远程氧微波等离子体对三种不同聚合物（LDPE、PS、PMMA）诱导的表面改性已通过 X 射线光电子能谱 (XPS) 进行了原位广泛研究，并在转移到大气中后通过飞行时间二次离子质谱 (TOF SIMS) 进行了广泛研究。通过从等离子体室直接转移到 XPS 光谱仪，可以识别并定量测定聚合物基材表面上引入的化学官能团。此外，通过 TOF SIMS 进行高分辨率分子分析可以更好地了解氧等离子体引起的化学变化。从这两种技术收集的信息使我们能够提出聚合物表面的氧化机制。远程放电中基态原子氧 O (3P) 的相对密度对于氧化的引发至关重要。该物种负责形成自由基，并进一步产生高度氧化的乐趣......
Surface modifications induced by a remote oxygen microwave plasma on three different polymers (LDPE, PS, PMMA) have been extensively investigated in situ by x‐ray photoelectron spectroscopy (XPS) and, after transfer in atmosphere, by time of flight secondary ion mass spectrometry (TOF SIMS). By a direct transfer from the plasma chamber to the XPS spectrometer the chemical functionalities introduced on the surface of the polymeric substrate are identified and quantitatively determined. Furthermore, high resolution molecular analysis by TOF SIMS allows a better understanding of the chemical changes induced by the oxygen plasma. The information gathered from the two techniques permits us to propose oxidation mechanisms of the polymer surfaces. The relative density of ground state atomic oxygen O (3P) in the remote discharge is shown to be of fundamental importance for the initiation of the oxidation. This species is responsible for the formation of radicals from which are further produced highly oxidized fun...