Experimental verification of light localization for disordered multilayers in the visible-infrared spectrum

Experimental verification of light localization for disordered multilayers in the visible-infrared spectrum
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DOI:
10.1103/physrevb.50.9810
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发表时间:
1994-10
期刊:
影响因子:
3.7
通讯作者:
Zhang Dao-zhong;H. Wei;Zhan Youlong;Li Zhao-lin;Cheng Bing-Ying;Yang Guo-zhen
Zhang Dao-zhong;H. Wei;Zhan Youlong;Li Zhao-lin;Cheng Bing-Ying;Yang Guo-zhen
中科院分区:
物理与天体物理2区
文献类型:
--
作者:
Zhang Dao-zhong;H. Wei;Zhan Youlong;Li Zhao-lin;Cheng Bing-Ying;Yang Guo-zhen

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我们测量了一个无序二元多层膜系统的光局域化长度,该无序二元多层膜系是由锑铁矿和冰晶石交替制备的。冰晶石层的厚度都是相同的,而锑的厚度在平均值附近随机变化。无序度由厚度的平均起伏给出。实验证明,光的传输强度随多层膜的长度呈指数衰减。局域化长度,即这种指数衰减的特征长度,是从固定无序度的720-900 nm波长范围内的实验数据得出的。利用传递矩阵法计算了不同入射波长下的局域化长度。实验测量结果与计算结果吻合较好。
We have measured the light localization length for a disordered binary multilayer system, which we have prepared by alternating layers of antimonite and cryolite. The thicknesses of the cryolite layers are all the same, while those of antimonite vary randomly around an average value. The degree of disorder is given by the average fluctuation of thicknesses. The exponential decay of transmission intensity of light with the length of the multilayer is demonstrated experimentally. The localization lengths, the characteristic length of this exponential decay, are derived from experimental data in the wavelength region 720-900 nm for a fixed degree of disorder. The localization lengths at different incident wavelengths are computed by transfer-matrix approach. The agreement between the experimental measurements and the calculations is good.