In Situ Characterization of the Local Work Function along Individual Free Standing Nanowire by Electrostatic Deflection.
In Situ Characterization of the Local Work Function along Individual Free Standing Nanowire by Electrostatic Deflection.
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DOI：
10.1038/srep21270
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发表时间：
2016-02-17
影响因子：
4.6
通讯作者：
Chen J
中科院分区：
文献类型：
--
作者：
Chen Y;Zhao C;Huang F;Zhan R;Deng S;Xu N;Chen J
准一维纳米材料功函数的原位表征对于探索其应用至关重要。在这里，我们建议利用纳米探针和纳米线之间的功函数差异引起的静电偏转来原位测量沿独立纳米线的局部功函数。详细讨论了测量的物理机制，并导出了偏转与电位差之间的抛物线关系。作为演示，我们已经高精度地测量了末端带有 Au 催化剂的 ZnO 纳米线和 LaB6 纳米线的尖端和侧壁的局部功函数。
In situ characterization of the work function of quasi one dimensional nanomaterials is essential for exploring their applications. Here we proposed to use the electrostatic deflection induced by work function difference between nanoprobe and nanowire for in situ measuring the local work function along a free standing nanowire. The physical mechanism for the measurement was discussed in details and a parabolic relationship between the deflection and the potential difference was derived. As a demonstration, measurement of the local work functions on the tip and the sidewall of a ZnO nanowire with Au catalyst at its end and a LaB6 nanowire have been achieved with good accuracy.