Concentric-annulus electrical capacitance tomography sensors

Concentric-annulus electrical capacitance tomography sensors
复制标题

DOI:
10.1088/0957-0233/24/9/095403
复制
发表时间:
2013-09-01
影响因子:
2.4
通讯作者:
Yang, Wuqiang
Yang, Wuqiang
中科院分区:
工程技术3区
文献类型:
--
作者:
Ye, Jiamin;Li, Yi;Yang, Wuqiang

文献摘要

被引文献

相似文献

本研究的目的是探讨独特形状(同心环)电容层析成像(ECT)传感器。这是出于提高使用具有内部-外部电极(IEE)的ECT传感器重建的图像的对比度和空间分辨率的期望。数值模拟和实验研究的目的是提供一个更好的理解的配置IEE传感器,内部屏蔽和测量策略。模拟结果与实验结果一致。利用线性反投影算法,12个外电极和4个内电极的IEE传感器,采用外-对-内的测量策略,可以重建高质量的图像。在实验研究中,内部屏蔽可能会降低从内部电极测量的电容的质量。
The aim of this research is to investigate the unique shape (concentric-annulus) electrical capacitance tomography (ECT) sensors. This is motivated by the desire to improve the contrast and spatial resolution of the images reconstructed using ECT sensors with internal-external electrodes (IEEs). Both numerical simulation and experimental study were carried out with the goal of providing an improved understanding of the configuration of IEE sensors, the internal shield and the measurement strategies. Simulation results are in agreement with the experimental results. Using the linear back projection algorithm, the IEE sensor with 12 external electrodes and 4 internal electrodes with the external-opposite-internal measurement strategy can reconstruct high-quality images. In experimental studies, the internal shield may reduce the quality of capacitance measured from the internal electrodes.