DSP-Driven Self-Tuning of RF Circuits for Process-Induced Performance Variability
DSP-Driven Self-Tuning of RF Circuits for Process-Induced Performance Variability
复制标题
DSP 驱动的 RF 电路自调节可解决工艺引起的性能变化
DOI：
10.1109/tvlsi.2008.2009454
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发表时间：
2010
影响因子：
2.8
通讯作者：
A. Chatterjee
中科院分区：
文献类型：
--
作者：
Donghoon Han;Byung;A. Chatterjee
在深亚微米设计体系中，射频电路预计将越来越容易受到工艺变化的影响，从而遭受参数良率的重大损失。为了解决这个问题，提出了一种旨在补偿多参数变化的制造后自调谐技术。所提出的方法结合了一个响应特征探测器和设计在射频电路中的硬件调谐旋钮。通过内置检测器和嵌入式模数转换器记录射频设备对特制诊断测试刺激的测试响应。利用运行在基带DSP处理器上的软件对性能补偿的最佳调谐旋钮控制值进行了分析和预测。因此，射频电路性能可以在外部测试设备的最小帮助下进行诊断和调整。多个射频性能参数可在调谐旋钮控制下同时调整。所提出的概念用于射频低噪声放大器（LNA）设计，也可以应用于其他射频电路。对制造的1.9 ghz LNAs的仿真案例研究和硬件测量表明，在关键的RF性能指标上，参数良率显著提高（高达58%）。
In the deep-submicrometer design regime, RF circuits are expected to be increasingly susceptible to process variations, and thereby suffer from significant loss of parametric yield. To address this problem, a postmanufacture self-tuning technique that aims to compensate for multiparameter variations is presented. The proposed method incorporates a ¿response feature¿ detector and ¿hardware tuning knobs,¿ designed into the RF circuit. The RF device test response to a specially crafted diagnostic test stimulus is logged via the built-in detector and embedded analog-to-digital converter. Analysis and prediction of the optimal tuning knob control values for performance compensation is performed using software running on the baseband DSP processor. As a result, the RF circuit performance can be diagnosed and tuned with minimal assistance from external test equipment. Multiple RF performance parameters can be adjusted simultaneously under tuning knob control. The proposed concepts are illustrated for an RF low-noise amplifier (LNA) design and can be applied to other RF circuits as well. A simulation case study and hardware measurements on a fabricated 1.9-GHz LNAs show significant parametric yield enhancement (up to 58%) across the critical RF performance specifications of interest.