Simulation of RF-focusing in the RFQ matching section by IGUN©
Simulation of RF-focusing in the RFQ matching section by IGUN©
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IGUN© 模拟 RFQ 匹配部分的 RF 聚焦
DOI：
10.1016/j.nima.2005.11.073
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发表时间：
2006
影响因子：
1.4
通讯作者：
R. Jameson
中科院分区：
文献类型：
--
作者：
R. Becker;R. Jameson
在设计和优化离子源和阴极之间的匹配时，缺少一种工具：无论是程序的计算离子提取和匹配的时间，（例如IGUN）必须在MEMS的入口法兰处停止，因为MEMS电极的RF聚焦（叶片或杆）不能被考虑，或者类似PARMTEQ的MEMS模拟程序不能考虑源自匹配透镜的静电场。因此，我们已经开发了一个简单的理论，如何考虑RF四极结构的RF聚焦以及在IGUN的零发射度模拟中由发射度引起的光束扩展。这允许非常有效地使用IGUN来设计离子源和阴极射线管之间的匹配，直到阴极射线管的径向匹配部分的末端。IGUN自动考虑到局部聚焦强度的双极电极，以调整空间电荷扩散，通过虚拟调整束流。IGUN中还增加了有限发射度的处理。
In the design and optimisation of the matching between an ion source and a RFQ there is a lacking tool: Either the program for the calculation of ion extraction and matching to the RFQ (e.g. IGUN) has to stop at the entrance flange of the RFQ, because the RF-focusing of the RFQ electrodes (vanes or rods) cannot be taken into account, or the RFQ simulation program, like PARMTEQ, cannot take into account static electric-field, which originate from the matching lens. We therefore have developed a simple theory, how to take into account the RF-focusing of a RF-quadrupole structure as well as the beam spreading by emittance in a simulation with zero emittance by IGUN. This allows very effective use of IGUN to design the matching between an ion source and the RFQ up to the end of the radial matching section of a RFQ. IGUN automatically takes into account the local focusing strength of the RFQ electrodes to adjust the space-charge spreading by virtually adjusting the beam current. Handling of a finite emittance has also been added to IGUN.