Pion contamination in the MICE muon beam

Pion contamination in the MICE muon beam
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DOI:
10.1088/1748-0221/11/03/p03001
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发表时间:
2015-11
影响因子:
1.3
通讯作者:
D. Adams;A. Alekou;M. Apollonio;R. Asfandiyarov;G. Barber;P. Barclay;A. Bari;R. Bayes;V. Bayliss;R. Bertoni;V. Blackmore;A. Blondel;S. Blot;M. Bogomilov;M. Bonesini;C. Booth;D. Bowring;S. Boyd;T. W. Brashaw;U. Bravar;A. Bross;M. Capponi;T. Carlisle;G. Cecchet;C. Charnley;F. Chignoli;D. Cline;J. Cobb;G. Colling;N. Collomb;L. Coney;P. Cooke;M. Courthold;L. Cremaldi;A. Demello;A. Dick;A. Dobbs;P. Dornan;M. Drews;F. Drielsma;F. Filthaut;T. Fitzpatrick;P. Franchini;V. Francis;L. Fry;A. Gallagher;R. Gamet;R. Gardener;S. Gourlay;Alec Grant;J. R. Greis;S. Griffiths;P. Hanlet;O. M. Hansen;G. Hanson;T. L. Hart;T. Hartnett;T. Hayler;C. Heidt;M. Hills;P. Hodgson;C. Hunt;A. Iaciofano;S. Ishimoto;G. Kafka;D. Kaplan;Y. Karadzhov;Y. K. Kim;Y. Kuno;P. Kyberd;J. Lagrange;J. Langlands;W. Lau;M. Leonova;Derun Li;A. Lintern;M. Littlefield;K. Long;T. Luo;C. Macwaters;B. Martlew;J. Martyniak;R. Mazza;S. Middleton;A. Moretti;A. Moss;A. Muir;I. Mullacrane;J. Nebrensky;D. Neuffer;A. Nichols;R. Nicholson;J. Nugent;A. Oates;Y. Onel;D. Orestano;E. Overton;P. Owens;V. Palladino;J. Pasternak;F. Pastore;C. Pidcott;M. Popovic;R. Preece;S. Prestemon;D. Rajaram;S. Ramberger;M. Rayner;S. Ricciardi;T. Roberts;M. Robinson;C. Rogers;K. Ronald;P. Rubinov;P. Rucinski;H. Sakamato;D. Sanders;E. Santos;T. Savidge;P. Smith;P. Snopok;F. Soler;D. Speirs;T. Stanley;G. Stokes;D. Summers;J. Tarrant;I. Taylor;L. Tortora;Y. Torun;R. Tsenov;C. D. Tunnell;M. Uchida;G. Vankova-Kirilova;S. Virostek;M. Vretenar;P. Warburton;S. Watson;C. White;C. Whyte;A. Wilson;M. Winter;X. Yang;A. Young;M. Zisman
D. Adams;A. Alekou;M. Apollonio;R. Asfandiyarov;G. Barber;P. Barclay;A. Bari;R. Bayes;V. Bayliss;R. Bertoni;V. Blackmore;A. Blondel;S. Blot;M. Bogomilov;M. Bonesini;C. Booth;D. Bowring;S. Boyd;T. W. Brashaw;U. Bravar;A. Bross;M. Capponi;T. Carlisle;G. Cecchet;C. Charnley;F. Chignoli;D. Cline;J. Cobb;G. Colling;N. Collomb;L. Coney;P. Cooke;M. Courthold;L. Cremaldi;A. Demello;A. Dick;A. Dobbs;P. Dornan;M. Drews;F. Drielsma;F. Filthaut;T. Fitzpatrick;P. Franchini;V. Francis;L. Fry;A. Gallagher;R. Gamet;R. Gardener;S. Gourlay;Alec Grant;J. R. Greis;S. Griffiths;P. Hanlet;O. M. Hansen;G. Hanson;T. L. Hart;T. Hartnett;T. Hayler;C. Heidt;M. Hills;P. Hodgson;C. Hunt;A. Iaciofano;S. Ishimoto;G. Kafka;D. Kaplan;Y. Karadzhov;Y. K. Kim;Y. Kuno;P. Kyberd;J. Lagrange;J. Langlands;W. Lau;M. Leonova;Derun Li;A. Lintern;M. Littlefield;K. Long;T. Luo;C. Macwaters;B. Martlew;J. Martyniak;R. Mazza;S. Middleton;A. Moretti;A. Moss;A. Muir;I. Mullacrane;J. Nebrensky;D. Neuffer;A. Nichols;R. Nicholson;J. Nugent;A. Oates;Y. Onel;D. Orestano;E. Overton;P. Owens;V. Palladino;J. Pasternak;F. Pastore;C. Pidcott;M. Popovic;R. Preece;S. Prestemon;D. Rajaram;S. Ramberger;M. Rayner;S. Ricciardi;T. Roberts;M. Robinson;C. Rogers;K. Ronald;P. Rubinov;P. Rucinski;H. Sakamato;D. Sanders;E. Santos;T. Savidge;P. Smith;P. Snopok;F. Soler;D. Speirs;T. Stanley;G. Stokes;D. Summers;J. Tarrant;I. Taylor;L. Tortora;Y. Torun;R. Tsenov;C. D. Tunnell;M. Uchida;G. Vankova-Kirilova;S. Virostek;M. Vretenar;P. Warburton;S. Watson;C. White;C. Whyte;A. Wilson;M. Winter;X. Yang;A. Young;M. Zisman
中科院分区:
工程技术4区
文献类型:
--
作者:
D. Adams;A. Alekou;M. Apollonio;R. Asfandiyarov;G. Barber;P. Barclay;A. Bari;R. Bayes;V. Bayliss;R. Bertoni;V. Blackmore;A. Blondel;S. Blot;M. Bogomilov;M. Bonesini;C. Booth;D. Bowring;S. Boyd;T. W. Brashaw;U. Bravar;A. Bross;M. Capponi;T. Carlisle;G. Cecchet;C. Charnley;F. Chignoli;D. Cline;J. Cobb;G. Colling;N. Collomb;L. Coney;P. Cooke;M. Courthold;L. Cremaldi;A. Demello;A. Dick;A. Dobbs;P. Dornan;M. Drews;F. Drielsma;F. Filthaut;T. Fitzpatrick;P. Franchini;V. Francis;L. Fry;A. Gallagher;R. Gamet;R. Gardener;S. Gourlay;Alec Grant;J. R. Greis;S. Griffiths;P. Hanlet;O. M. Hansen;G. Hanson;T. L. Hart;T. Hartnett;T. Hayler;C. Heidt;M. Hills;P. Hodgson;C. Hunt;A. Iaciofano;S. Ishimoto;G. Kafka;D. Kaplan;Y. Karadzhov;Y. K. Kim;Y. Kuno;P. Kyberd;J. Lagrange;J. Langlands;W. Lau;M. Leonova;Derun Li;A. Lintern;M. Littlefield;K. Long;T. Luo;C. Macwaters;B. Martlew;J. Martyniak;R. Mazza;S. Middleton;A. Moretti;A. Moss;A. Muir;I. Mullacrane;J. Nebrensky;D. Neuffer;A. Nichols;R. Nicholson;J. Nugent;A. Oates;Y. Onel;D. Orestano;E. Overton;P. Owens;V. Palladino;J. Pasternak;F. Pastore;C. Pidcott;M. Popovic;R. Preece;S. Prestemon;D. Rajaram;S. Ramberger;M. Rayner;S. Ricciardi;T. Roberts;M. Robinson;C. Rogers;K. Ronald;P. Rubinov;P. Rucinski;H. Sakamato;D. Sanders;E. Santos;T. Savidge;P. Smith;P. Snopok;F. Soler;D. Speirs;T. Stanley;G. Stokes;D. Summers;J. Tarrant;I. Taylor;L. Tortora;Y. Torun;R. Tsenov;C. D. Tunnell;M. Uchida;G. Vankova-Kirilova;S. Virostek;M. Vretenar;P. Warburton;S. Watson;C. White;C. Whyte;A. Wilson;M. Winter;X. Yang;A. Young;M. Zisman

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国际μ子电离冷却实验(MICE)将在卢瑟福阿普尔顿实验室的ISIS设施中使用动量在140和240 MeV/c之间的μ子束进行电离冷却的系统研究。MICE中电离冷却的测量依赖于选择穿过实验的纯μ子样品。为了做出这种选择,MICE μ子束被设计为提供污染小于101%的μ子束。为了进行最终的μ子选择,MICE在冷却单元的上游和下游采用了粒子识别(PID)系统。PID系统包括飞行时间的hodoscope,阈值切伦科夫计数器和量热法。在90%C. L.时,测量的π介子污染上限为fπ < 1.4%。包括系统的不确定性。因此,MICE μ子束能够满足电离冷却研究中严格的π介子污染要求。
The international Muon Ionization Cooling Experiment (MICE) will perform a systematic investigation of ionization cooling with muon beams of momentum between 140 and 240 MeV/c at the Rutherford Appleton Laboratory ISIS facility. The measurement of ionization cooling in MICE relies on the selection of a pure sample of muons that traverse the experiment. To make this selection, the MICE Muon Beam is designed to deliver a beam of muons with less than ∼1% contamination. To make the final muon selection, MICE employs a particle-identification (PID) system upstream and downstream of the cooling cell. The PID system includes time-of-flight hodoscopes, threshold-Cherenkov counters and calorimetry. The upper limit for the pion contamination measured in this paper is fπ < 1.4% at 90% C.L., including systematic uncertainties. Therefore, the MICE Muon Beam is able to meet the stringent pion-contamination requirements of the study of ionization cooling.