Transient and steady-state space-charge-limited currents in polyfluorene copolymer diode structures with ohmic hole injecting contacts
Transient and steady-state space-charge-limited currents in polyfluorene copolymer diode structures with ohmic hole injecting contacts
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DOI：
10.1063/1.126182
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发表时间：
2000-03-27
影响因子：
4
通讯作者：
Woo, EP
中科院分区：
文献类型：
--
作者：
Campbell, AJ;Bradley, DDC;Woo, EP
我们报告了包含电致发光聚芴共聚物（9,9-二辛基芴-co-双-N，N'-（4-甲氧基苯基）-双-N，N'-苯基-1,4苯基二胺）的二极管结构的详细测量。通过氧等离子体清洗的氧化铟锡（ITO）电极，涂有聚（乙烯二氧氧噻吩）/聚苯乙烯磺酸（PEDOT/PSS）薄膜的未经处理的ITO和用PEDOT/PSS等离子体清洗的ITO实现欧姆注射。然后，瞬态暗注入和飞行时间迁移率测量以及稳态电流密度与电压的测量结果与正载流子、无陷阱、限制空间电荷的电流完全一致。然而，对于没有PEDOT/PSS的未经处理的ITO和蒸发的Au触点，观察到注射受限的行为。(C) 2000年美国物理研究所。[s0003 - 6951 (00) 04211 - x)。
We report detailed measurements on diode structures containing the electroluminescent polyfluorene copolymer poly(9,9-dioctylfluorene-co-bis-N,N'-(4-methoxyphenyl)-bis-N,N'-phenyl-1,4 phenylenediamine). Ohmic injection of holes is achieved with an oxygen plasma cleaned indium tin oxide (ITO) electrode, untreated ITO coated with a film of poly(ethylenedioxythiophene)/polystyrenesulphonic acid (PEDOT/PSS) and plasma cleaned ITO with PEDOT/PSS. Transient dark injection and time-of-flight mobility measurements and steady state current density versus voltage measurements are then entirely consistent with a positive carrier, trap-free, space-charge-limited current. Injection limited behavior is observed, however, for untreated ITO without PEDOT/PSS and for evaporated Au contacts. (C) 2000 American Institute of Physics. [S0003-6951(00)04211-X].