Computational Screening and Multiscale Simulation of Barrier-Free Contacts for 2D Semiconductor pFETs
Computational Screening and Multiscale Simulation of Barrier-Free Contacts for 2D Semiconductor pFETs
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2D 半导体 pFET 无障碍接触的计算筛选和多尺度仿真
DOI:
10.1109/iedm45625.2022.10019377
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发表时间:
2022
期刊:
影响因子:
--
通讯作者:
Ikeda, Junya
中科院分区:
文献类型:
--
作者:
Yang, Ning;Lin, Yuxuan Cosmi;Chuu, Chih-Piao;Rahman, Saifur;Wu, Tong;Chou, Ang-Sheng;Liew, San-Lin;Fujiwara, Kohei;Chen, Hung-Yu;Ikeda, Junya
Low-resistance p-type contacts to two-dimensional (2D) semiconductors remains a critical challenge towards the industrial application of 2D channel materials in advanced logic technology. To address this challenge, we computationally screen and identify designs for ultralow-resistance p-type contacts to 2D semiconductors such as WSe2by combining ab initio density-functional-theory (DFT) and quantum device simulations. Two new contact strategies, van der Waals metallic contact (such as 1H-NbS2), and bulk semimetallic contact (such as Co3Sn2S2), are identified as realistic pathways to achieving Schottky-barrier-free and low-contact-resistance p-type contacts for 2D semiconductor pFETs. Simulations of these new strategies suggest reduced metal-induced gap states, negligible Schottky barrier height and small contact resistance (down to ~20 Ω·μm). Preliminary experimental results in developing Co3Sn2S2as a new semimetal contact material are also demonstrated.