Measurement and analysis of physical defects for dynamic supply current testing
Measurement and analysis of physical defects for dynamic supply current testing
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动态电源电流测试的物理缺陷测量和分析
DOI：
10.1109/delta.2004.10031
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发表时间：
2004
期刊：
影响因子：
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通讯作者：
Sai Kishore Vavilala
中科院分区：
文献类型：
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作者：
S. Thomas;R. Makki;Sai Kishore Vavilala
我们提出了一个iDDT故障分析研究的基础上的物理测量电路的内置缺陷。各种各样的缺陷被插入到基本的电路元件中。测量结果被用来更好地模拟缺陷对iDDT的影响，并改进模拟故障模型。
We present an iDDT fault analysis study based on physical measurements of circuits with built-in defects. A variety of defects were inserted into basic circuit components. The measured results were utilized to better model the effect of defects on iDDT and improve simulated fault models.