A Brief Comment on Atom Probe Tomography Applications
A Brief Comment on Atom Probe Tomography Applications
复制标题
原子探针断层扫描应用简评
DOI:
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发表时间:
2016
期刊:
影响因子:
--
通讯作者:
Chan‐Gyung Park
中科院分区:
文献类型:
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作者:
J. Seol;Young‐Tae Kim;Chan‐Gyung Park
Atom probe tomography (APT) has been widely applied to wide range of materials including metals, metal alloys, ceramics, and semiconductors for going through threedimensional distribution, segregation or partitioning of trace elements. For example, this high-resolution characterization technique helps to understand diffusion of light element (e.g., boron and carbon), segregation at inter faces, gradients in chemical composition between second phase precipitate particles and their host matrix phase (Bang et al., 2015; Kim et al., 2015; Park et al., 2015; Seol et al., 2010, 2011, 2012, 2013a, 2013b, 2013c, 2016a). Recent significant advances of pulsedlaser APT system now enable analysis of biological material to obtain 3D spatial distributions of cellular ions (Gordon & Joester, 2011; Karlsson et al., 2015; Narayan et al., 2012). By applying high positive voltage to a very sharp specimen having a radius of curvature under 50 nm, the atoms at the very surface of specimen are field-evaporated almost atomby-atom and atomic-layer after atomic-layer. The fieldevaporated atoms are ionized on tip surface and accelerated towards a position sensitive detector that records their time of flight (ToF) and impact position, simultaneously. The ToF of the ion is directly related to its kinetic energy and potential energy, so by equating the two energies, the mass-to-charge ratio (m/n) of the ion can be determined as below and it enables the identification of elemental species. A 3D elemental map can be reconstructed from the collected data. More details of principle are described in following reference (Gault et al., 2012; Kelly & Miller, 2007; Larson et al., 2013b; Miller & Forbes, 2014).
影响因子:
3.2
作者:
Choi, Pyuck-Pa;Cojocaru-Miredin, Oana;Raabe, Dierk
通讯作者:
Raabe, Dierk