Cobalt Oxide (CoOx) as an Efficient Hole-Extracting Layer for High-Performance Inverted Planar Perovskite Solar Cells.
Cobalt Oxide (CoOx) as an Efficient Hole-Extracting Layer for High-Performance Inverted Planar Perovskite Solar Cells.
复制标题
DOI：
10.1021/acsami.6b10803
复制
发表时间：
2016-11
影响因子：
9.5
通讯作者：
A. Shalan;Tomoya Oshikiri;Sudhakar Narra;Mahmoud M. Elshanawany;K. Ueno;Hui-ping Wu;Keisuke Nakamura-Keisuke-Nakamur
中科院分区：
文献类型：
--
作者：
A. Shalan;Tomoya Oshikiri;Sudhakar Narra;Mahmoud M. Elshanawany;K. Ueno;Hui-ping Wu;Keisuke Nakamura-Keisuke-Nakamur
CoOx 是一种很有前景的空穴提取层 (HEL)，适用于器件配置为 ITO/CoOx/CH3NH3PbI3/PCBM/Ag 的倒置平面钙钛矿太阳能电池。根据简单的溶液程序制造的器件表现出最佳的光伏性能，在 AM 1.5 G 1 太阳照射下达到 14.5% 的功率转换效率 (PCE)，这明显优于相同实验条件下使用传统 HEL 制造的材料，如 PEDOT:PSS (12.2%)、NiOx (10.2%) 和 CuOx (9.4%)。我们使用 XPS 表征化学成分，使用 XRD 表征晶体结构，并使用 SEM/AFM 技术表征薄膜形态。记录了沉积在不同HEL薄膜上的钙钛矿的光致发光（PL）光谱和相应的PL衰减，以获得空穴提取特性，其中空穴提取时间的顺序为CoOx（2.8 ns）<PEDOT：PSS（17.5 ns）< NiOx（22.8 ns）< CuOx（208.5 ns），这与它们的光伏性能趋势一致。对这些器件的再现性和持久稳定性进行了检查，结果表明由金属氧化物 HEL 制成的器件具有出色的长期稳定性，其中 CoOx 器件在超过 1000 小时内保持 PCE 约 12%。
CoOx is a promising hole-extracting layer (HEL) for inverted planar perovskite solar cells with device configuration ITO/CoOx/CH3NH3PbI3/PCBM/Ag. The devices fabricated according to a simple solution procedure showed the best photovoltaic performance attaining power conversion efficiency (PCE) of 14.5% under AM 1.5 G 1 sun irradiation, which is significantly superior to those of materials fabricated with a traditional HEL such as PEDOT:PSS (12.2%), NiOx (10.2%), and CuOx (9.4%) under the same experimental conditions. We characterized the chemical compositions with XPS, crystal structures with XRD, and film morphology with SEM/AFM techniques. Photoluminescence (PL) spectra and the corresponding PL decays for perovskite deposited on varied HEL films were recorded to obtain the hole-extracting characteristics, for which the hole-extracting times show the order CoOx (2.8 ns) < PEDOT:PSS (17.5 ns) < NiOx (22.8 ns) < CuOx (208.5 ns), consistent with the trend of their photovoltaic performances. The reproducibility and enduring stability of those devices were examined to show the outstanding long-term stability of the devices made of metal oxide HEL, for which the CoOx device retained PCE ≈ 12% for over 1000 h.