Full-scan LBIST with capture-per-cycle hybrid test points
Full-scan LBIST with capture-per-cycle hybrid test points
复制标题
具有每周期捕获混合测试点的全扫描 LBIST
DOI：
10.1109/test.2017.8242036
复制
发表时间：
2017
期刊：
影响因子：
--
通讯作者：
Justyna Zawada
中科院分区：
文献类型：
--
作者：
Sylwester Milewski;N. Mukherjee;J. Rajski;J. Solecki;J. Tyszer;Justyna Zawada
本文介绍了一种新型的基于低区域扫描的逻辑内置自我测试（LBIST）方案，该方案解决了某些应用程序域（例如快速增长的汽车电子市场）的严格测试要求。这些要求在很大程度上由安全标准驱动，可以大大减少测试申请时间，同时保留传统士兵方案的高断层覆盖范围。另外，可以考虑在同一时间间隔内应用大量的向量。尽管新方案可能类似于传统的BIST逻辑，但它是通过传统的扫描链和每周循环驱动的混合测试点以每次测试方式进行测试的伪随机测试模式的组合，从而创建了这种新的协同LBIST范围。混合观测点插入最合适的位置，将每个移位周期捕获到形成单独的扫描链的专用触发器中。它们的内容逐渐转移到压实器中，该压缩机与剩余的扫描链共享，这些扫描链一旦整个测试模式转移，这些扫描链仍会提供测试响应。对于工业设计获得的实验结果表明，在测试时间，测试覆盖范围和开销面积方面，提出的BIST方案的可行性，在此报告。
This paper presents a novel low-area scan-based logic built-in self-test (LBIST) scheme that addresses stringent test requirements of certain application domains such as the fast-growing automotive electronics market. These requirements, largely driven by safety standards, are met by significantly reducing test application time while preserving the high fault coverage of conventional BIST schemes. Alternatively, one may consider applying a much larger number of vectors within the same time interval. Although the new scheme may resemble traditional BIST logic, it is a combination of pseudorandom test patterns delivered in a test-per-clock fashion through conventional scan chains and per-cycle-driven hybrid test points that creates this new synergistic LBIST paradigm. The hybrid observation points, inserted at the most suitable locations, capture faulty effects every shift cycle into dedicated flip-flops that form separate scan chains. Their content is gradually shifted into a compactor, which is shared with the remaining scan chains that still deliver test responses captured once the entire test pattern has been shifted-in. Experimental results obtained for industrial designs illustrate feasibility of the proposed BIST scheme in terms of test time, test coverage, and area overhead, and they are reported herein.