A new approach for low-power scan testing
A new approach for low-power scan testing
复制标题
低功耗扫描测试的新方法
DOI：
10.1109/test.2003.1270873
复制
发表时间：
2003
期刊：
影响因子：
--
通讯作者：
M. Watari
中科院分区：
文献类型：
--
作者：
T. Yoshida;M. Watari
随着半导体制造技术的进步，扫描测试中的功耗和噪声已经成为一个关键问题。在对实际大规模集成电路制造的研究中，我们发现在扫描测试的移位操作中，电源电压下降会导致测试问题，并对这种现象及其原因进行了分析。本文提出了一种新的测试方法MD-SCAN(多占空比扫描)，解决了扫描测试中的电源压降问题，并提供了一种有效的应用方法。
As semiconductor manufacturing technology advances, power dissipation and noise in scan testing has become a critical problem. In our studies on practical LSI manufacturing, we have found that power supply voltage drops cause testing problems during shift operations in scan testing and we have analyzed this phenomenon and its causes. In this paper, we present a new testing method named MD-SCAN (Multi Duty-Scan) which solves power supply voltage drop problems in scan testing, as well as offering an eficient method of appkcation.