Constant-Phase-Element Behavior Caused by Resistivity Distributions in Films I. Theory

Constant-Phase-Element Behavior Caused by Resistivity Distributions in Films I. Theory
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DOI:
10.1149/1.3499564
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发表时间:
2010-01-01
影响因子:
3.9
通讯作者:
Musiani, Marco
Musiani, Marco
中科院分区:
工程技术4区
文献类型:
--
作者:
Hirschorn, Bryan;Orazem, Mark E.;Musiani, Marco

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恒相元件(CPE)的行为可以归因于薄膜中物理性质的分布,在与电极表面垂直的方向上。数值模拟结果表明,在介电常数与位置无关的假设下,局部电阻率的正态幂律分布与CPE一致。建立了对应于电阻率幂律分布的阻抗解析表达式,并用于建立CPE参数与薄膜物理性质之间的关系。将所得阻抗响应与杨氏电阻率分布所得阻抗响应进行了比较。(C) 2010电化学学会。[DOI: 10.1149/1.3499564]版权所有。
Constant-phase element (CPE) behavior may be attributed to the distribution of physical properties in films, in the direction normal to the electrode surface. Numerical simulations were used to show that under assumption that the dielectric constant is independent of position, a normal power-law distribution of local resistivity is consistent with the CPE. An analytic expression for the impedance corresponding to a power-law distribution of resistivity was developed and used to establish a relationship between parameters for the CPE and physical properties of the film. The resulting impedance response was compared to that obtained from the Young resistivity distribution. (C) 2010 The Electrochemical Society. [DOI: 10.1149/1.3499564] All rights reserved.