Sensitivity of resonance frequency in the detection of thin layer using nano-slit structures

Sensitivity of resonance frequency in the detection of thin layer using nano-slit structures
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使用纳米狭缝结构检测薄层时共振频率的灵敏度

DOI:
10.1093/imamat/hxaa041
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发表时间:
2020
影响因子:
1.2
通讯作者:
Zhang, Hai
Zhang, Hai
中科院分区:
数学4区
文献类型:
--
作者:
Lin, Junshan;Oh, Sang-Hyun;Zhang, Hai

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推导了纳米狭缝结构用于薄层探测时的共振频率及其灵敏度的计算公式。对于沉积在纳米结构上的厚度为的薄层,我们定量地表明,对于具有狭缝孔径尺寸的单个狭缝结构和周期性狭缝结构,共振频率的灵敏度随着增加而降低。具体地说,灵敏度是有序的,否则。倏逝波模式沿着薄介质膜和上面的环境介质之间的界面存在。从数学推导中可以看出,谐振频率的灵敏度很大程度上取决于微小狭缝上的倏逝波模式的影响。
We derive the formulas for the resonance frequencies and their sensitivity when the nano-slit structures are used in the detection of thin layers. For a thin layer with a thickness ofdeposited over the nanostructure, we show quantitatively that for both single and periodic slit structures with slit aperture size, the sensitivity of resonance frequency reduces asincreases. Specifically, the sensitivity is of orderifand of orderotherwise. The evanescent wave modes are present along the interface between the thin dielectric film and ambient medium above. From the mathematical derivations, it is observed that the sensitivity of the resonance frequency highly depends on the effect of evanescent wave modes on the tiny slit apertures.
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