Sensitivity of resonance frequency in the detection of thin layer using nano-slit structures
Sensitivity of resonance frequency in the detection of thin layer using nano-slit structures
复制标题
使用纳米狭缝结构检测薄层时共振频率的灵敏度
DOI:
10.1093/imamat/hxaa041
复制
发表时间:
2020
影响因子:
1.2
通讯作者:
Zhang, Hai
中科院分区:
文献类型:
--
作者:
Lin, Junshan;Oh, Sang-Hyun;Zhang, Hai
We derive the formulas for the resonance frequencies and their sensitivity when the nano-slit structures are used in the detection of thin layers. For a thin layer with a thickness ofdeposited over the nanostructure, we show quantitatively that for both single and periodic slit structures with slit aperture size, the sensitivity of resonance frequency reduces asincreases. Specifically, the sensitivity is of orderifand of orderotherwise. The evanescent wave modes are present along the interface between the thin dielectric film and ambient medium above. From the mathematical derivations, it is observed that the sensitivity of the resonance frequency highly depends on the effect of evanescent wave modes on the tiny slit apertures.
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影响因子:
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作者:
Ebbesen, TW;Lezec, HJ;Wolff, PA
通讯作者:
Wolff, PA
DOI:
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发表时间:
1993
期刊:
影响因子:
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作者:
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D. G. Markushevich
DOI:
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发表时间:
2011
期刊:
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DOI:
10.1136/ebmh.11.4.102
发表时间:
2008-10
期刊:
Evidence Based Mental Health
影响因子:
--
作者:
P. Cochat;L. Vaucoret;J. Sarles
通讯作者:
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