On-line BIST for performance failure prediction under aging effects in automotive safety-critical applications
On-line BIST for performance failure prediction under aging effects in automotive safety-critical applications
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用于汽车安全关键应用中老化影响下的性能故障预测的在线 BIST
DOI：
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发表时间：
2011
期刊：
影响因子：
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通讯作者：
João Paulo Teixeira
中科院分区：
文献类型：
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作者：
R. S. Oliveira;J. Semião;I. Teixeira;Marcelino B. Santos;João Paulo Teixeira
在工艺、电源电压、温度和老化(PVTA)变化下，高性能数字系统的电子设计是一个具有挑战性的过程。这种变化会导致不正常的计时延迟，导致系统错误，对安全关键型应用有害。性能故障预测(PFP)取代错误检测变得必要，尤其是在存在老化效应的情况下。本文提出了一种标准单元设计流程中PFP的在线内建自测试方法。该方法基于与关键信号路径相关联的异常延迟检测。设计了PVTA感应型老化传感器。采用多层次模拟。执行功能和结构测试模式生成，以检测关键路径延迟故障为目标。提出了一种传感器插入技术，以及专利软件工具DyDA的升级版本。最后，利用老化降级因子的概念，提出了一种新的门级老化故障注入策略。给出了采用商用UMC 130 nm工艺和法拉第™单元库设计的串并接口控制器的设计结果。由于负偏压热不稳定(NBTI)导致的老化，只需要七个传感器来监控不安全的性能操作。
Electronic design of high-performance digital systems in nano-scale CMOS technologies under Process, power supply Voltage, Temperature and Aging (PVTA) variations is a challenging process. Such variations induce abnormal timing delays leading to systems errors, harmful in safety-critical applications. Performance Failure Prediction (PFP), instead of error detection, becomes necessary, particularly in the presence of aging effects. In this paper, an on-line BIST methodology for PFP in a standard cell design flow is proposed. The methodology is based on abnormal delay detection associated with critical signal paths. PVTA-aware aging sensors are designed. Multilevel simulation is used. Functional and structural test pattern generation is performed, targeting the detection of critical path delay faults. A sensor insertion technique is proposed, together with an up-graded version of a proprietary software tool, DyDA. Finally, a novel strategy for gate-level Aging fault injection is proposed, using the concept of an Aging de-rating factor. Results are presented for a Serial Parallel Interface (SPI) controller, designed with commercial UMC 130nm CMOS technology and Faraday™ cell library. Only seven sensors are required to monitor unsafe performance operation, due to Negative Bias Thermal Instability (NBTI)-induced aging.