An End-to-End Toolchain: From Automated Cost Modeling to Static WCET and WCEC Analysis
An End-to-End Toolchain: From Automated Cost Modeling to Static WCET and WCEC Analysis
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端到端工具链:从自动成本建模到静态 WCET 和 WCEC 分析
DOI:
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发表时间:
2017
期刊:
影响因子:
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通讯作者:
Wolfgang Schröder
中科院分区:
文献类型:
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作者:
V. Sieh;Robert Burlacu;Timo Hönig;Heiko Janker;Phillip Raffeck;Peter Wägemann;Wolfgang Schröder
Reliable and fine-grained cost-models are fundamental for real-time systems to statically predict worst-case execution time (WCET) estimates of program code in order to guarantee timeliness. Analogous considerations hold for energy-constrained systems where worst-case energy consumption (WCEC) values are mandatory to ensure meeting predefined energy budgets. These cost models are generally unavailable for commercial off-the-shelf (COTS) hardware platforms, although static worst-case analysis tools require those models in order to predict the WCET as well as the WCEC of program code. To solve this problem, we present NEO, an end-to-end toolchain to automate cost-model generation for both WCET and WCEC analyses. NEO exploits automatically generated benchmarks, which are input for 1) an instruction-level emulation and 2) automatically conducted execution-time and energy-consumption measurements on the target platform. The gathered values (i.e., occurrences per instruction, execution-time and energy-consumption per benchmark) are combined as mathematical optimization problems. The solutions to the formulated problems, which are designed to reveal the worst-case behavior, yield the respective cost models. To statically determine upper bounds of benchmarks, we integrated the cost models into the state-of-the-art WCET analyzer PLATIN. Our evaluations on COTS hardware reveal that our open-source, end-to-end toolchain NEO yields accurate worst-case bounds.
DOI:
10.1109/rtas.2017.37
发表时间:
2017-04
期刊:
2017 IEEE Real-Time and Embedded Technology and Applications Symposium (RTAS)
影响因子:
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作者:
Christian J. Dietrich;Peter Wägemann;Peter Ulbrich;Daniel Lohmann
通讯作者:
Christian J. Dietrich;Peter Wägemann;Peter Ulbrich;Daniel Lohmann
DOI:
10.1109/rtas.2017.6
发表时间:
2017
期刊:
2017 IEEE Real-Time and Embedded Technology and Applications Symposium (RTAS)
影响因子:
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作者:
P. Wägemann;T. Distler;C. Eichler;W. Schröder-Preikschat
通讯作者:
W. Schröder-Preikschat