WIGNER CRYSTALLIZATION AND METAL-INSULATOR TRANSITION OF TWO-DIMENSIONAL HOLES IN GAAS AT B = 0
WIGNER CRYSTALLIZATION AND METAL-INSULATOR TRANSITION OF TWO-DIMENSIONAL HOLES IN GAAS AT B = 0
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B = 0 时 GAAS 中二维孔的维格纳结晶和金属绝缘体转变
DOI:
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发表时间:
1998
期刊:
影响因子:
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通讯作者:
M. Shayegan
中科院分区:
文献类型:
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作者:
Jongsoo Yoon;C. C. Li;D. Shahar;D. Tsui;M. Shayegan
We report the transport properties of a low disorder two-dimensional hole system (2DHS) in the GaAs/AlGaAs heterostructure, which has an unprecedentedly high peak mobility of $7 imes 10^5cm^2/Vs$, with hole density of $4.8 imes 10^9 cm^{-2}<p<3.72 imes 10^{10}cm^{-2}$ in the temperature range of $50mK<T<1.3K$. From their T, p, and electric field dependences, we find that the metal-insulator transition in zero magnetic field in this exceptionally clean 2DHS occurs at $r_s=35.1pm0.9$, which is in good agreement with the critical $r_s$ for Wigner crystallization ${r_s}^c=37pm 5$, predicted by Tanatar and Ceperley for an ideally clean 2D system.