Automatic XAFS measurement system developed at BL14B2 in SPring-8.
Automatic XAFS measurement system developed at BL14B2 in SPring-8.
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DOI：
10.1107/s0909049511042518
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发表时间：
2012-01
影响因子：
2.5
通讯作者：
Honma T
中科院分区：
文献类型：
--
作者：
Oji H;Taniguchi Y;Hirayama S;Ofuchi H;Takagaki M;Honma T
研制了一种新型的自动测量系统，可对80个样品进行透射式和荧光式的XAFS测量。开发了一种新的XAFS测量系统，其中可以进行XAFS测量，包括样品加载和探测器调整。利用该系统，可以在传输和荧光两种模式下对多达80个样品进行XAFS测量。光学元件的调整也已实现自动化。它不仅节省了人力和测量时间，而且提高了样本比对的准确性和可靠性。
A novel automatic measurement system has been developed, in which the XAFS measurement of up to 80 samples in transmission and fluorescence modes can be carried out. A novel XAFS measurement system has been developed in which XAFS measurements can be performed including sample-loading and detector adjustments. With this system, XAFS measurements of up to 80 samples in both transmission and fluorescence modes can be carried out. The adjustment of the optical components has also been automated. It not only saves manpower and measurement time, but also improves the accuracy and reliability of sample alignments.