Characteristic length scale of bicontinuous nanoporous structure by fast Fourier transform
Characteristic length scale of bicontinuous nanoporous structure by fast Fourier transform
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DOI：
10.1143/jjap.47.1161
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发表时间：
2008-02-01
影响因子：
1.5
通讯作者：
Chen, Ming Wei
中科院分区：
文献类型：
--
作者：
Fujita, Takeshi;Chen, Ming Wei
提出了一种基于快速傅立叶变换（FFT）的双连续纳米孔结构特征长度尺度测量方法。通过旋转平均来自扫描电子显微镜（SEM）或透射电子显微镜（TEM）的纳米多孔显微照片的FFT功率谱，可以获得功率谱中的显著峰，其反映准周期结构的特征长度尺度。这种方法被证明是经常观察到的纳米多孔金属制备的化学或电化学脱合金的双连续形态。
We propose a method derived from fast Fourier transform (FFT) process to measure the characteristic length scale of bicontinuous nanoporous structures. By rotationally averaging the FFT power spectrum of a nanoporous micrograph from scanning electron microscope (SEM) or transmission electron microscope (TEM), a significant peak in the power spectrum can be obtained, which reflects the characteristic length scale of the quasi-periodic structure. This method is demonstrated for the bicontinuous morphology that is frequently observed in nanoporous metals prepared by chemical or electrochemical dealloying.