EXIT CONDITIONS FOR SECONDARY-ION EMISSION INDUCED BY KEV CLUSTER BOMBARDMENT
EXIT CONDITIONS FOR SECONDARY-ION EMISSION INDUCED BY KEV CLUSTER BOMBARDMENT
复制标题
DOI：
10.1016/0168-583x(93)96034-a
复制
发表时间：
1993-07-01
影响因子：
1.3
通讯作者：
SCHWEIKERT, EA
中科院分区：
文献类型：
--
作者：
RAY, KB;PARK, MA;SCHWEIKERT, EA
用符合计数飞行时间质谱法研究了CsI和苯丙氨酸表面通过keV原子和簇弹撞击发射的二次离子。结果表明，并不是所有的脱附事件都是等效的。次级离子的相关程度被观察到是一个反函数的动能和复杂性，或效率，主离子。在研究的案例中，二次离子相关性的变化归因于离子形成途径的变化以及一次抛射激发的表面体积。
The emission of secondary ions from CsI and phenylalanine surfaces via keV atomic and cluster projectile impacts was studied with coincidence counting time-of-flight mass spectrometry. The results show that not all desorption events from a given projectile are equivalent. The degree of secondary ion correlation was observed to be an inverse function of the kinetic energy and complexity, or efficiency, of the primary ion. For the cases studied, changes in secondary ion correlation are attributed to a change in the ion formation pathway as well as the surface volume excited by a primary projectile.