X‐ray fluorescence analysis using ultrasonic levitation technique
X‐ray fluorescence analysis using ultrasonic levitation technique
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DOI：
10.1002/xrs.3337
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发表时间：
2023-03
影响因子：
1.2
通讯作者：
Masakiyo Okuda;T. Matsuyama;K. Tsuji
中科院分区：
文献类型：
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作者：
Masakiyo Okuda;T. Matsuyama;K. Tsuji
薄膜用作样品支架，用于使用 X 射线荧光 (XRF) 分析溶液和固体样品。入射 X 射线在样品和薄膜上发生散射，散射的 X 射线在 XRF 光谱中充当背景信号。为了降低背景信号的强度，本文开发了一种用于 XRF 测量的超声悬浮方法。超声波悬浮装置配备换能器（变幅杆）和反射器，将小尺寸样品悬浮在产生的驻波的节点周围；因此，不需要样品架。对 Fe 溶液 (2 µL) 进行分析以评估所开发的仪器。比较了使用 0 分钟和 60 分钟悬浮时间获得的结果。超声悬浮时溶剂滴几乎蒸发；因此，XRF和入射X射线的吸收效应以及入射X射线的散射效应减弱。悬浮时间60分钟时，Fe Kα峰的净强度增加，背景强度降低。定义了悬浮时间与Fe Kα峰的净强度或背景强度之间的关系；因此，成功地观察到了样品液滴的凝结。使用内标法进行定量分析。相对强度（目标元素和内标元素的净强度之比）与浓度比成正比。因此，该方法可用于在低背景强度下测量痕量元素并阐明样品液滴的冷凝过程。
A thin film is used as the sample holder for analyzing solutions and solid samples using x‐ray fluorescence (XRF). The incident x‐rays are scattered on the sample and thin film, and the scattered x‐rays serve as background signals in the XRF spectra. To reduce the intensity of the background signal, an ultrasonic levitation method was developed herein for XRF measurements. The ultrasonic levitation device is equipped with a transducer (horn) and reflector, and a small‐size sample is levitated around a node of a generated standing wave; thus, a sample holder is not necessary. Fe solution (2 μL) was analyzed to evaluate the developed instrument. The results obtained using levitation times of 0 and 60 min were compared. The solvent droplet almost evaporated during ultrasonic levitation; therefore, the absorption effects of XRFs and incident x‐rays and the scattering effect of incident x‐rays were reduced. At a levitation time of 60 min, the net intensity of the Fe Kα peak was increased, and the background intensity decreased. The relationship between the levitation time and the net or background intensities of the Fe Kα peak was defined; thus, condensation of the sample droplet was successfully observed. Quantitative analysis was performed using an internal standard method. The relative intensity (ratio of the net intensities of the target and internal standard elements) was proportional to the concentration ratio. Therefore, this method is useful for measuring trace elements at low background intensity and elucidating the process of condensation of a sample droplet.