Density Profile and Fluctuation Measurements by Microwave Reflectometry on EAST
Density Profile and Fluctuation Measurements by Microwave Reflectometry on EAST
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EAST 上微波反射仪的密度分布和波动测量
DOI：
10.1088/1009-0630/16/4/02
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发表时间：
2014-04
影响因子：
1.7
通讯作者：
EAST Team
中科院分区：
文献类型：
--
作者：
Liu Zixi;Bu Jingliang;Li Jiangang;EAST Team
在EAST托卡马克装置上研制了一套工作在V波段的微波反射测量系统。反射计系统，使用由任意波形发生器驱动的压控振荡器（VCO）源，具有高的时间分辨率，可以操作用于密度轮廓测量。台架测试结果表明，压控振荡器的输出频率与时间呈线性关系。本文测定并报道了反射计系统的色散。在EAST托卡马克装置上用反射计观测到了H模放电中L-H跃迁过程中基座密度分布的演变。用频率合成器代替压控振荡器作为密度起伏测量的微波源。当等离子体进入H模时，基座中的密度涨落水平突然下降。观察到频率约为100 kHz的相干模式，并且模式频率随着基座的演变而逐渐减小。
A microwave reflectometry system operating in the V-band frequency with extraordinary mode polarization has been developed on the EAST tokamak. The reflectometry system, using a voltage-controlled oscillator (VCO) source driven by an arbitrary waveform generator with high temporal resolution, can operate for the density profile measurement. The result of the bench test shows that the output frequency of the VCO has a linear dependence on time. The dispersion of reflectometry system is determined and reported in this paper. The evolution of a pedestal density profile during the L-H transition is observed by the reflectometry in H-mode discharges on EAST tokamak. A frequency synthesizer is used to replace the VCO as microwave source for density fluctuation measurements. The level of density fluctuation in the pedestal shows an abrupt decrease when the plasma enters into H-mode. A coherent mode with a frequency of about 100 kHz is observed and the mode frequency decreases gradually as the pedestal evolves.
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影响因子：
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作者：
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DOI：
10.1063/1.2972134
发表时间：
2008-10
期刊：
The Review of scientific instruments
影响因子：
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DOI：
10.1063/1.3657157
发表时间：
2011-10
期刊：
The Review of scientific instruments
影响因子：
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作者：
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