Hopping in exponential bandtails in high electric fields and transport models in amorphous silicon

Hopping in exponential bandtails in high electric fields and transport models in amorphous silicon
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高电场中指数带尾的跳跃和非晶硅中的输运模型

DOI:
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发表时间:
1993
期刊:
影响因子:
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通讯作者:
J. Tauc
J. Tauc
中科院分区:
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文献类型:
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作者:
R. I. Devlen;H. Antoniadis;E. Schiff;J. Tauc

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摘要本文计算了指数带尾态间过量载流子跳跃热化过程中的电输运。计算是基于一个典型的速率近似。对于smali电场的计算再现多重捕获色散,与先前的研究一致。对于高电场电输运成为非线性的,主要是由于电场诱导的色散参数的增加。该计算应对比最近的工作Esipov扩展带尾多重捕获,将隧道传输的边缘,在他的计算中,非线性传输设置在没有变化的色散。我们认为,这些结果区分跳跃和迁移率边缘模型的电子热化测量在a-Si:H。
Abstract A calculation of electrical transport during the thermalization of excess carrier hopping between states of an exponential bandtail is presented. The calculation is based on a typical rate approximation. For smali electric fields the calculation reproduces multiple-trapping dispersion, in agreement with prior research. For high electric fields electrical transport becomes nonlinear, primarily due to an electric-field-induced increase in the dispersion parameter. The calculation should be contrasted to recent work of Esipov which extended bandtail multiple-trapping to incorporate tunnelling to a transport edge; in his calculation nonlinear transport set in without changes in the dispersion. We suggest that these results discriminate between hopping and mobility-edge models for electron thermalization measurements in a-Si: H.