X-ray scattering study of the Ge(001): Te(1X1) surface structure
X-ray scattering study of the Ge(001): Te(1X1) surface structure
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Ge(001): Te(1X1) 表面结构的 X 射线散射研究
DOI：
10.1103/physrevb.61.16692
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发表时间：
2000
期刊：
影响因子：
--
通讯作者：
M. Bedzyk
中科院分区：
文献类型：
--
作者：
O. Sakata;P. Lyman;B. Tinkham;D. Walko;D. Marasco;Tien;M. Bedzyk
通过分析沿几个表面晶体截断棒（CTR）的 X 射线散射强度，研究了吸附在 Ge（001）上的 Te 的 1x1 表面结构。将结果与对应于桥、顶部、反桥和空心场地模型的模拟进行了比较。桥梁现场的 Te 的意见最为一致。然后将基于桥位处 Te 修改的更复杂的表面模型与缺失行模型的数据进行比较，该模型比之字形模型的一致性更好。最后，利用CTR数据来细化缺失行模型的结构参数。 (c) 2000 年美国物理学会。
The 1x1 surface structure of Te adsorbed on Ge(001) was studied by analyzing the x-ray scattered intensity along several surface crystal truncation rods (CTR). The results were compared to simulations corresponding to the bridge, top, antibridge, and hollow site models. Te at the bridge site was in best agreement. More complex surface models based on modifications of Te at the bridge site were then compared to the data with the missing-row model being in better agreement than the zigzag model. Finally, the CTR data were used to refine the structural parameters of the missing row model. (c) 2000 The American Physical Society.