Ar 3p photoelectron sideband spectra in two-color XUV + NIR laser fields
Ar 3p photoelectron sideband spectra in two-color XUV + NIR laser fields
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DOI：
10.1088/1361-6455/aab257
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发表时间：
2018-03
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通讯作者：
S. Minemoto;H. Shimada;Kazma Komatsu;W. Komatsubara;T. Majima;T. Mizuno;S. Owada;H. Sakai;T. Togashi;S. Yoshida;M. Yabashi;A. Yagishita
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文献类型：
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作者：
S. Minemoto;H. Shimada;Kazma Komatsu;W. Komatsubara;T. Majima;T. Mizuno;S. Owada;H. Sakai;T. Togashi;S. Yoshida;M. Yabashi;A. Yagishita
我们进行了光电子能谱使用飞秒XUV脉冲从自由电子激光器和飞秒近红外脉冲从同步激光器，并成功地测量Ar 3p光电子边带光谱由于双色阈上电离。在基于强场近似的一阶含时微扰理论模型的计算中，考虑到XUV和NIR脉冲之间的时间抖动，很好地再现了光电子边带谱及其角分布，表明我们实验中的时间抖动分布在1.0 + 0.4 − 0.2 ps的宽度上。该方法可作为评价自由电子激光实验中不可避免的时间抖动的一种方法。
We performed photoelectron spectroscopy using femtosecond XUV pulses from a free-electron laser and femtosecond near-infrared pulses from a synchronized laser, and succeeded in measuring Ar 3p photoelectron sideband spectra due to the two-color above-threshold ionization. In our calculations of the first-order time-dependent perturbation theoretical model based on the strong field approximation, the photoelectron sideband spectra and their angular distributions are well reproduced by considering the timing jitter between the XUV and the NIR pulses, showing that the timing jitter in our experiments was distributed over the width of 1.0 + 0.4 − 0.2 ps. The present approach can be used as a method to evaluate the timing jitter inevitable in FEL experiments.