Error analysis of the rapid lifetime determination method for double-exponential decays and new windowing schemes
Error analysis of the rapid lifetime determination method for double-exponential decays and new windowing schemes
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DOI：
10.1021/ac981050d
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发表时间：
1999-03-01
影响因子：
7.4
通讯作者：
Snow, NH
中科院分区：
文献类型：
--
作者：
Sharman, KK;Periasamy, A;Snow, NH
快速寿命测定方法(RLD)是一种用于快速估算指数衰变寿命的数学方法，它已被应用于发光显微镜和单分子寿命估算。到目前为止，主要应用一直是单指数评估。我们将该方法推广到双指数，利用蒙特卡罗模拟，我们评估了具有已知寿命的双指数衰减和具有未知指数前因子和寿命的双指数衰减的性能。精度是作为噪声水平(泊松统计)、寿命比率、指数前因子比率和拟合窗口的函数来评估的。确定了最佳的测量条件。RLD被证明在广泛的实际实验条件下工作良好。在已知寿命的情况下，即使在低总计数(10(4))的情况下，指数前因子也能以较高的精度确定，而指数前因子和寿命未知时，精度会降低，但仍然可以接受。一种新的门控方案(重叠门控)在单指数衰减的情况下提供了更高的精度，理论预测与来自激光寿命仪的实际实验数据进行了验证。
The rapid lifetime determination method (RLD) is a mathematical technique for extremely rapid evaluations of lifetimes in exponential decays, It has been applied in luminescence microscopy and single-molecule lifetime evaluation. To date, the primary application has been in single-exponential evaluations. We present extensions of the method to double exponentials, Using Monte Carlo simulations, we assess the performance of both the double-exponential decay with known lifetimes and the double-exponential decay with unknown preexponential factors and lifetimes. Precision is evaluated as a function of the noise level (Poisson statistics), the ratios of the lifetimes, the ratios of their preexponential factors, and the fitting window. Optimum measurement conditions are determined. RLD is shown to work well over a wide range of practical experimental conditions. If the lifetimes are known, the preexponential factors can be determined with good precision even at low total counts (10(4)), With unknown preexponential factors and lifetimes, precisions decrease but are still acceptable. A new gating scheme (overlapped gating) is shown to offer improved precision for the case of a single-exponential decay, Theoretical predictions are tested against actual experimental data from a laser-based lifetime instrument.