EUV Spectroscopy of Highly Charged Xenon Ions Created Using an Electron Beam Ion Trap
EUV Spectroscopy of Highly Charged Xenon Ions Created Using an Electron Beam Ion Trap
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发表时间:
2007-03
影响因子:
2.9
通讯作者:
K. Fahy;E. Sokell;G. O’Sullivan;A. Aguilar;J. Pomeroy;J. N. Tan;J. Gillaspy
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文献类型:
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作者:
K. Fahy;E. Sokell;G. O’Sullivan;A. Aguilar;J. Pomeroy;J. N. Tan;J. Gillaspy