Study of the N2O Molecule Using Electron Beams
Study of the N2O Molecule Using Electron Beams
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利用电子束研究 N2O 分子
DOI：
10.1063/1.1701077
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发表时间：
1961
影响因子：
4.4
通讯作者：
G. Schulz
中科院分区：
文献类型：
--
作者：
G. Schulz
N2O 中的非弹性过程和负离子形成分别使用俘获电子法和传统技术进行测量。在 2.2 ev 处观察到一个大的非弹性过程，该过程被解释为通过形成临时负离子态而形成振动激发的 N2O。负离子 O− 从 0 ev 开始观察到，负离子电流的峰值出现在 0.7 和 2.2 ev 处。后一个峰归因于临时负离子的形成，随后在各种振动激发状态下衰变成稳定的 O+N2。负离子动能的测量证实了这一假设。 N2O 中 N2-O 键的解离能值是从 O− 的表观势外推至零动能得出的。该值 D (N2–O) = 1.2±0.2 ev，在实验误差范围内与 Curran 和 Fox 独立发现的 1.3±0.2 值一致，但与热化学值 1.66 ev 不一致。
Inelastic processes and negative ion formation in N2O are measured using the trapped‐electron method and conventional techniques, respectively. A large inelastic process is observed at 2.2 ev and is interpreted as the formation of vibrationally excited N2O via the formation of a temporary negative ion state. Negative ions O− are observed beginning at zero ev with peaks of the negative ion current occurring at 0.7 and 2.2 ev. The latter peak is attributed to the formation of the temporary negative ion with subsequent decay into a stable O− plus N2 in various states of vibrational excitation. Measurements of the kinetic energy of the negative ions confirm this hypothesis. A value of the dissociation energy of the N2–O bond in N2O is found from the appearance potential of O− extrapolated to zero kinetic energy. This value, D (N2–O) = 1.2±0.2 ev, agrees within experimental error with the value of 1.3±0.2 found independently by Curran and Fox, but disagrees with the thermochemical value of 1.66 ev.