Characterisation of amorphous and nanocrystalline molecular materials by total scattering
Characterisation of amorphous and nanocrystalline molecular materials by total scattering
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DOI：
10.1039/b915453a
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发表时间：
2010-01-01
期刊：
影响因子：
3.1
通讯作者：
Shankland, Kenneth
中科院分区：
文献类型：
--
作者：
Billinge, Simon J. L.;Dykhne, Timur;Shankland, Kenneth
使用高能X射线全散射耦合对分布函数分析产生独特的结构指纹从非晶和纳米结构相的药物卡马西平和吲哚美辛。这样的设施为基础的实验室为基础的实验的优点进行了讨论，并说明了该技术与熔融淬火样品的卡马西平作为一个纳米晶（4.5 nm域直径）的形式III的版本的表征。
The use of high-energy X-ray total scattering coupled with pair distribution function analysis produces unique structural fingerprints from amorphous and nanostructured phases of the pharmaceuticals carbamazepine and indomethacin. The advantages of such facility-based experiments over laboratory-based ones are discussed and the technique is illustrated with the characterisation of a melt-quenched sample of carbamazepine as a nanocrystalline (4.5 nm domain diameter) version of form III.