Effects of annealing ambient on ferroelectric properties and surface chemistry of sol–gel derived Bi3.25La0.75Ti3O12 thin films

Effects of annealing ambient on ferroelectric properties and surface chemistry of sol–gel derived Bi3.25La0.75Ti3O12 thin films
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DOI:
10.1007/s10854-013-1592-5
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发表时间:
2013
期刊:
Journal of Materials Science: Materials in Electronics
影响因子:
--
通讯作者:
Jia Li;M. Yoshitake;Weijie Song
Jia Li;M. Yoshitake;Weijie Song
中科院分区:
其他
文献类型:
--
作者:
Jia Li;M. Yoshitake;Weijie Song

文献摘要

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本文采用溶胶-凝胶法制备了Bi_(3.25)La_(0.75)Ti_3 O_(12)(BLT)薄膜,并在Ar或O_2气氛中进行了快速退火。研究了退火环境、铁电特性和BLT薄膜表面化学之间的关系。在Ar气氛中退火的BLT薄膜比在O2气氛中退火的BLT薄膜结晶程度低、表面不致密、极化值小。经过109次循环后,在Ar中退火的BLT薄膜的剩余极化下降到初始值的83.5%,而在O2中退火的样品的剩余极化仍为初始值的89.5%。X射线光电子能谱分析结果表明,Ar气氛下退火样品的疲劳性能较差是薄膜中Bi和Ti离子附近氧空位的综合结果。
In this work, Bi3.25La0.75Ti3O12(BLT) thin films were prepared by sol–gel coatings followed by rapid thermal annealing in Ar or O2ambient. The correlation among annealing ambient, ferroelectric characteristics and surface chemistry of the BLT thin films were investigated. The BLT thin film annealed in Ar showed weaker crystallization, less dense surface and smaller polarization value than that annealed in O2. After 109cycles, the remnant polarization of the BLT film annealed in Ar decreased to 83.5 % of the initial value while it remained 89.5 % for the sample annealed in O2. X-ray photoelectron spectroscopy results indicated the inferior fatigue characteristics of the sample annealed in Ar was the comprehensive result of oxygen vacancies vicinity to Bi and Ti ion in the thin film.