Infrared Imaging and Spectroscopy Beyond the Diffraction Limit
Infrared Imaging and Spectroscopy Beyond the Diffraction Limit
复制标题
DOI：
10.1146/annurev-anchem-071114-040435
复制
发表时间：
2015-01-01
期刊：
影响因子：
--
通讯作者：
Centrone, Andrea
中科院分区：
文献类型：
--
作者：
Centrone, Andrea
纳米技术的进步是由空间分辨率与纳米材料的长度尺度相称的测量方法的可用性促成的，并取决于这种测量方法的可用性。散射扫描近场光学显微镜和光热诱导共振等化学成像技术为科学家提供了提取纳米级丰富的化学和结构信息的手段。本文首先介绍了红外光谱和显微技术的一些基本知识，然后详细介绍了S近场光学显微镜和红外光谱仪的工作原理。将纳米尺度光谱与广泛应用于化学鉴定的远场宏观光谱进行了比较。精选的例子说明了测量的技术方面或在材料科学中的应用。这项审查的核心是记录纳米级红外光谱的能力，因为尽管化学地图能够立即可视化，但光谱提供了解释图像和表征样品的信息。纳米材料和生物应用的日益广泛表明，该领域将迅速增长。
Progress in nanotechnology is enabled by and dependent on the availability of measurement methods with spatial resolution commensurate with nanomaterials' length scales. Chemical imaging techniques, such as scattering scanning near-field optical microscopy (s-SNOM) and photothermal-induced resonance (PTIR), have provided scientists with means of extracting rich chemical and structural information with nanoscale resolution. This review presents some basics of infrared spectroscopy and microscopy, followed by detailed descriptions of s-SNOM and PTIR working principles. Nanoscale spectra are compared with far-field macroscale spectra, which are widely used for chemical identification. Selected examples illustrate either technical aspects of the measurements or applications in materials science. Central to this review is the ability to record nanoscale infrared spectra because, although chemical maps enable immediate visualization, the spectra provide information to interpret the images and characterize the sample. The growing breadth of nanomaterials and biological applications suggest rapid growth for this field.