Application of Elliptic Fourier Descriptors to Symmetry Detection Under Parallel Projection

Application of Elliptic Fourier Descriptors to Symmetry Detection Under Parallel Projection
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椭圆傅立叶描述子在平行投影对称性检测中的应用

DOI：
10.1109/34.276127
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发表时间：
1994
期刊：
IEEE Trans. Pattern Anal. Mach. Intell.
影响因子：
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通讯作者：
Dennis N. K. Leung
Dennis N. K. Leung
中科院分区：
--
文献类型：
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作者：
Raymond K. K. Yip;P. Tam;Dennis N. K. Leung

文献摘要

被引文献

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本文采用弧长参数化的椭圆傅立叶描述子方法解决平行投影下对称性的检测与恢复问题。一个简单快速的迭代算法和对称性不变量为平行投影下对称性的检测和恢复提供了足够的信息。所提出的方法已被广泛测试，使用不同的平行投影下的对称图形。给出了算法的仿真结果。本文还将该方法推广到平行投影下的平面目标识别。>
In this paper, the method of elliptic Fourier descriptors using arc length parameterization is applied to tackle the problem of detection and recovery of symmetry under parallel projection. A simple and fast iteration algorithm together with the invariants of symmetry provides sufficient information for the detection and recovery of symmetry under parallel projection. The proposed method has been extensively tested using symmetric figures under different parallel projections. Simulation results of the algorithm are presented. The extension of this method for planar object recognition under parallel projection is also addressed. >