Surfaces of polymer blends: X‐ray photoelectron spectroscopy studies of polystyrene/poly(vinyl methyl ether) blends
Surfaces of polymer blends: X‐ray photoelectron spectroscopy studies of polystyrene/poly(vinyl methyl ether) blends
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DOI：
10.1063/1.335858
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发表时间：
1985-10
影响因子：
3.2
通讯作者：
David H. Pan;W. Prest
中科院分区：
文献类型：
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作者：
David H. Pan;W. Prest
用X射线光电子能谱（XPS）研究了聚苯乙烯（PS）/聚乙烯基甲基醚（PVME）共混物的表面组成。XPS结果表明，表面的组成之间存在显著差异（例如，最外面的约6 nm）和可混溶和不混溶共混物的主体。从甲苯或三氯乙烯溶液中浸涂的PS/PVME膜的表面被发现富含PVME。一个额外的富集在表面的PVME含量也观察到混溶性PS/PVME共混物相分离时，通过加热它们高于较低的临界溶液温度。通过角相关XPS测量获得了可混溶的50/50（w）共混物的平均组成分布。该实验表明，富集是浓度梯度而不是单层涂层的结果。这些结果进行了讨论的PS和PVME的表面自由能和混合的程度在表面层。
The surface compositions of polystyrene (PS)/poly(vinyl methyl ether) (PVME) blends have been investigated using x‐ray photoelectron spectroscopy (XPS). The XPS results demonstrate that there are significant differences between the composition of the surfaces (e.g., outmost ∼6 nm) and the bulk of both miscible and immiscible blends. The surfaces of PS/PVME films dip‐coated from either toluene or trichloroethylene solutions are found to be enriched in PVME. An additional enrichment in the PVME content of the surface is also observed when miscible PS/PVME blends are phase separated by heating them above the lower critical solution temperature. The average composition profile of a miscible 50/50(w) blend has been obtained by angular‐dependent XPS measurements. This experiment suggests that the enrichment is the result of a concentration gradient rather than a monolayer coating. These results are discussed in terms of the surface free energies of PS and PVME and the degree of mixing in the surface layer.