A technique for improved focused ion beam milling of cryo-prepared life science specimens
A technique for improved focused ion beam milling of cryo-prepared life science specimens
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DOI：
10.1111/j.1365-2818.2007.01775.x
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发表时间：
2007-06-01
影响因子：
2
通讯作者：
Findlay, K. C.
中科院分区：
文献类型：
--
作者：
Hayles, M. F.;Stokes, D. J.;Findlay, K. C.
聚焦离子束和扫描电子显微镜与低温制备/转移系统的结合允许在低温下研磨样品。然而，特别是对于生物样本，结果的质量在很大程度上取决于样本表面的正确处理。我们展示了一种在冷冻样品上沉积保护性平坦化表面层的方法，从而能够使用离子束进行高质量横截面并研究纳米尺度的结构。
The combination of focused ion beam and scanning electron microscopy with a cryo-preparation/transfer system allows specimens to be milled at low temperatures. However, for biological specimens in particular, the quality of results is strongly dependent on correct preparation of the specimen surface. We demonstrate a method for deposition of a protective, planarizing surface layer onto a cryo-sample, enabling high-quality cross-sectioning using the ion beam and investigation of structures at the nanoscale.