A local and global statistics pattern analysis method and its application to process fault identification
A local and global statistics pattern analysis method and its application to process fault identification
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DOI:
10.1016/j.cjche.2015.09.004
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发表时间:
2015-11
影响因子:
3.8
通讯作者:
Hanyuan Zhang;Xuemin Tian;Xiaogang Deng;Lianfang Cai
中科院分区:
文献类型:
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作者:
Hanyuan Zhang;Xuemin Tian;Xiaogang Deng;Lianfang Cai