Interlaboratory standardization and calibration of day mineral crystallinity and crystallite size data
Interlaboratory standardization and calibration of day mineral crystallinity and crystallite size data
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DOI：
10.1111/j.1525-1314.1994.tb00010.x
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发表时间：
1994-03
影响因子：
3.4
通讯作者：
L. Warr;A. Rice
中科院分区：
文献类型：
--
作者：
L. Warr;A. Rice
通过 X 射线衍射 (XRD) 测定的粘土矿物结晶度和微晶（域）尺寸数据是广泛用于表征极低级变质条件的方法。然而，由于缺乏足够的实验室间标准化，不同研究组之间的比较变得不可靠，因为分析过程中使用的机器条件、测量方法和样品制备不同，导致获得的数值结果存在显着差异。提出了一种使用岩片标准对数据进行标准化的校准方法，该方法可以直接定量比较不同研究小组产生的数据集。提出了标准化尺度，即结晶度指数标准（CIS），伊利石结晶度纵带边界限值为 0.25dΔ2θ 和 0.42dΔ2θ，等效伊利石晶粒尺寸分别为 52 和 23 nm，由 Warren-Averbach 方法确定。校准新旧数据将使相似和对比地质环境之间进行更可靠的比较，并应提高 XRD 数据与极低级变质作用的其他指标之间相关性的准确性和可靠性，从而增加此类粘土矿物研究的价值。
Clay mineral crystallinity and crystallite (domain) size data determined by X-ray diffraction (XRD) are methods extensively used in the characterization of very low-grade metamorphic conditions. However, the lack of sufficient interlaboratory standardization has made comparisons between different research groups unreliable due to significant variations in numerical results obtained, a consequence of the different machine conditions, measurement methods and sample preparations used during analysis. A calibration approach to the standardization of data using rock chip standards is presented, which allows data sets produced by different research groups to be directly and quantitatively compared. A standardized scale, the crystallinity index standard (CIS), is proposed, with illite crystallinity anchizonal boundary limits of 0.25dΔ2θ and 0.42dΔ2θ, and equivalent illite crystallite sizes of 52 and 23 nm, respectively, determined by the Warren-Averbach method. Calibrating both old and new data will enable more reliable comparisons between similar and contrasting geological environments, and should improve the accuracy and reliability of correlations made between XRD data and other indicators of very low-grade metamorphism, hence increasing the value of such clay mineral studies.